A field-effect transistor (FET) is a type of transistor commonly used for weak-signal amplification (for example, for amplifying wireless signals). It is also a semiconductor device that outputs current in proportion to its input voltage. FETs use a small amount of control current to regulate a larger output current. The device can amplify analog or digital signals. It can also switch DC or function as an oscillator.
Fairchild RFP40N10 power MOSFETs
Gideon Analytical Laboratories receivedthree Fairchild RFP40N10 power MOSFETs. A MOSFET is a specific type of metal oxide semiconductor …
January 26, 2018IXYSRF DE375-601N21A MOSFET
Gideon Analytical Laboratories received one IXYSRF DE375-501N21A MOSFET for electronic failure analysis. A MOSFET is a type of field-effect …
January 26, 2018MuRata PS (Pn 8600118) MOSFET Failures
Gideon Analytical Laboratories received 8Murata Ps DC-DC converters (pn 8600118) with suspected MOSFET failures. A DC-DC converter is an …
April 3, 2017IR AUIRF7648M2 Power MOSFET
Gideon Analytical Laboratories received two failed AUIRF7648M2 MOSFETs. These are rather new on the market and specifically designed for the …
October 24, 20142N3700 Transistor
Gideon Analytical Laboratories received one 2N3700 transistor for failure analysis. A new 2N3700 transistor was also received for …
October 23, 2014Linear Microcircuit Modular Hybrid
Gideon Analytical Laboratories received one linear microcircuit modular hybrid FK23009 for electronic failure analysis. A hybrid integrated …
April 10, 2014FCS RV4141V GFI Controller
Gideon Analytical Labs received two failed RV4141AM ground fault interrupter controllers. The devices had far different impedance values …
May 30, 2013Siliconix Si4998DY MOSFET
Gideon Analytical Laboratories received several dual N-channel SO-9 Vishay Siliconix MOSFETs. MOSFETs are transistors used for amplifying or …
April 2, 2013Failure Analysis of EDN337N FET
Gideon Analytical labs received one FDN337N-channel FET for failure analysis. The Drain-Source was reported shorted. Super SOTTM-3 N-Channel …
December 1, 2012Synchronous Buck Driver TI UCC27223PWP Failure Analysis
Gideon Analytical Laboratories received two failed TI UCC27223PWP and three vintage devices for comparison. Two 14 pin Dip TI UCC27223PWP …
December 1, 2012Fairchild RFP40N10 MOSFET Failure Analysis
Gideon Analytical Laboratories received three-failed Fairchild RFP40N10 power MOSFETs. All the terminals were shorted. A MOSFET is a …
November 26, 2012IR FR22ON MOSFET Failure Analysis
Gideon Analytical Laboratories received a failed IR FR22ON MOSFET within DC-DC converter. All the MOSFETs were shorted on all terminals. The …
November 22, 2012











