Success Stories

Failure Analysis of Vishay SQD50P04-13L MOSFET (Part 1)

Gideon was asked to perform a failure analysis on two Vishay SQD50P04-13L MOSFETs in TO-252 packages. The failed MOSFETs arrived on two PCBs. There was no external damage to the package on either Q27 or Q14. Since MOSFETs typically fail with all terminals shorted, it is imperative to examine the remainder of the die for evidence that may or may not be present to determine a cause for the EOS.