Passivation Integrity Test

Gideon Analytical Laboratories performed failure analysis on several IXYSIGBT IXGH32N60B transistors, encased in TO-247 packages. These transistors are 60 amp 600V 2.3 Rds 200W. The concern was that the devices were not functioning as 600V but topped out at 480V in the application. After failure analysis was performed on the transistors, the company requested that Gideon Analytical Laboratories administer passivation integrity tests on the two good IXYSIGBT IXGH32N60B transistors. The transistors were prepared for passivation integrity testing.