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Semiconductor Failure Analysis

13 stories in this category.

ICs with different functions in the electronic industry.

- IC Failure Analysis (Integrated Circuit)
- Radiography
Sunon Maglev MC35101V2-000U-G99 12V Fans
Gideon Analytical Laboratories received two Sunon Maglev MC35101V2-000U-G99 12V fans which did not operate. Along with the nonoperational …
June 3, 2019
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Programmable Logic Device
Gideon Analytical Laboratories received a programmable logic device (PLD) P18586P for failure analysis. A programmable logic device is an …
November 25, 2018
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Failed On Semi MC14070BG CMOS SSI
Gideon Analytical Analytical Laboratories received one On Semi MC14070BG CMOS SSI in a SOEIAJ-14 package, with the 15V supply line pulled …
February 1, 2018
- Semiconductor Failure Analysis
Honeywell SS466A Hall Effect Sensor Failure
Gideon Analytical Laboratories received one Honeywell SS466A Hall effect sensor encapsulated in epoxy for failure analysis. A Hall effect …
January 18, 2018
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Atmel AT91SAM9260 Based Embedded MPU
Gideon Analytical Laboratories, Inc. received Atmel AT91SAM9260 based Embedded MPU; it is a 180 MHz ARM926EJ-S ARM Thumb Processor. The …
October 23, 2014
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Compound Gate Drivers
Gideon Analytical Laboratories received four National LM5111-1m dual 5A compound gate drivers. There were two bad devices and two good ones …
July 2, 2014
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Vishay 5962-9562301Q3A, Integrated Circuit Failure Analysis
Gideon Analytical Laboratories received two integrated circuits for failure analysis. Integrated circuits (ICs) are an assembly of …
July 2, 2014
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
LM5111-1M Dual 5A Compound Gate Drivers
" Gideon Analytical Laboratories received four National Semiconductor LM5111-1M dual 5A compound gate drivers. A gate driver is a power …
March 28, 2014
- Semiconductor Failure Analysis
RV4140A Ground Fault Interrupter
Gideon Analytical Laboratories received two failed RV4140A ground fault interrupter controllers. The devices had far different impedance …
May 31, 2013
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Single End AD73311L Processor
Gideon Analytical Laboratories received two AD73311L CMOS general purpose analog front end processors. Each device had external thermal …
May 31, 2013
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
CMOS RC Timer
Gideon Analytical Laboratories received two ICM7555 CMOS RC timers. Each device was pulling down the output. The ICM7556 is a CMOS RC timer …
April 24, 2013
- IC Failure Analysis (Integrated Circuit)
- Semiconductor Failure Analysis
Digital Signal Processors (DSPs)
Gideon Analytical Laboratories received eighteen digital signal processors (DSPs) for failure analysis. A DSP is a microprocessor …
April 17, 2013